Testing and diagnostic device for digital computers

摘要: For error testing and diagnostics in EDP systems, particular storage elements (e.g., 6) are connected to form an addressable matrix which is coupled a maintenance service processor (5) or external tester through the system bus (9). During normal operation, logic subsystems (10), of processors (1) processing units consist, by elements. Through bus, transfers addresses test data addressed from where they fed turn respond such data, transferring (partial) result thus received In next step, causes for analysis be fetched reconnected matrix.