The behavior of silicon and boron in the surface of corroded nuclear waste glasses : an EFTEM study.

摘要: Using electron energy-loss filtered transmission microscopy (EFTEM), we have observed the formation of silicon-rich zones on corroded surface a West Valley (WV6) glass. This layer is approximately 100-200 nm thick and directly underneath precipitated smectite clay layer. Under conventional (C)TEM illumination, this invisible; indeed, more commonly used analytical techniques, such as x-ray energy dispersive spectroscopy (EDS), failed to describe fully localized changes in boron silicon contents across region. Similar boron-depleted were not found Savannah River Laboratory (SRL) borosilicate glasses, including SRL-EA SRL-51, although they possessed similar-looking layers. study demonstrates new tool for examining surfaces materials.