作者: K C Elsom , J R Sambles
DOI: 10.1088/0305-4608/11/3/012
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摘要: The effect of macroscopic surface roughness upon the resistivity thin metal films has been calculated by computer modelling form these films. It is shown that, as a consequence tendency for to be islandised, function decreasing mean film thickness rises well above predictions conventional scattering theories. Theoretical results are compared with existing experimental evidence and good agreement obtained potassium, gold, aluminium, copper palladium.