X-ray optics and beam characterization using random modulation: experiments.

摘要: A parallel paper [Berujon, Cojocaru, Piault, Celestre, Roth, Barrett & Ziegler (2020), J. Synchrotron Rad. 27, 284–292] reviewed theoretically some of the available processing schemes for X-ray wavefront sensing based on random modulation. Shown here are experimental applications technique characterizing both refractive and reflective optical components. These fast accurate at-wavelength metrology methods can assist manufacture optics that transport beams with a minimum amount distortion. It is also recalled how such facilitate online optimization active optics.