作者: F. Eßer , O. Drachenko , A. Patanè , M. Ozerov , S. Winnerl
DOI: 10.1063/1.4928623
关键词:
摘要: We use cyclotron resonance THz-spectroscopy in pulsed magnetic fields up to 63 T measure the electron effective mass Si-doped GaAsN semiconductor alloys with nitrogen content 0.2%. This technique directly probes transport properties of N-modified conduction band, particularly mass, which has been discussed controversially experimental and theoretical literature. report a slight increase nonparabolicity N-content for different photon energies agreement two-level band anticrossing model calculations. Furthermore, we show pronounced mobility drop increasing N-content.