作者: F. Rey-García , M.T. Flores-Arias , C. Gómez-Reino , G.F. De La Fuente , W. Assenmacher
DOI: 10.1016/J.OPTMAT.2012.07.016
关键词:
摘要: Planar multilayer ZrO2:CeO2 slab waveguides were prepared by a sol–gel route and dip-coating technique onto commercial glass substrates. The coatings microstructurally characterized transmission electron microscopy (TEM), X-ray diffraction (XRD) optical confocal microscopy. Coating thicknesses of ca. 500 nm refractive index values 2.069 ± 0.001 2.087 0.001, respectively for TE TM light polarization modes, calculated Dark m-line spectroscopy. This is consistent with the birefringent character coating, associated to presence anisotropic crystalline phases within coating’s vitreous matrix. Finally, propagation losses 0.9 0.2 1.5 dB/cm determined scattered measurement respectively.