搜索历史记录选项已关闭,请开启搜索历史记录选项。
作者: J. Granlund
DOI: 10.1109/EDL.1980.25269
关键词:
摘要: The resistance of the metallization a FET gate stripe has effect placing non-linear R(I) in series with junction. A simple means calculating is developed, and curve drop across R(1) at milliampere forward biases given.
Annales Des Télécommunications,1992, 引用: 3
Solar Cells,1984, 引用: 18
Solar Cells,1984, 引用: 54
IEEE Transactions on Microwave Theory and Techniques,1988, 引用: 1,889
Electronics Letters,1984, 引用: 1
IEEE Transactions on Electron Devices,1986, 引用: 76
Solid-state Electronics,2011, 引用: 11
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems,1983, 引用: 5
IEE Proceedings G Circuits, Devices and Systems,1993, 引用: 15
IEEE Transactions on Microwave Theory and Techniques,1980, 引用: 154