Combinational logic analysis case studies using laser voltage probing
作者： Winson Lua , Gopinath Ranganathan , Venkat Krishnan Ravikumar , Angeline Phoa
DOI: 10.1109/IPFA.2016.7564246
关键词:
摘要: Combinational logic analysis has been introduced to improve fault isolation when using laser voltage probing on standard cells. The technique shown offer more reliable within a shorter time thereby increasing FI efficiency. This paper uses interesting case studies showcase how incorporating into conventional significantly improves the success rate of failure analysis.
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