METHOD AND DEVICE FOR INSPECTING CONTACT STATE

摘要: PURPOSE:To provide for a contact state inspection method and the device enabling floating of electronic parts to be judged in short time with high reliability by non-destructive inspection. CONSTITUTION:A position relationship between bump 2 land 5 when X rays are emitted from directly above that while being inclined at certain angle obtained. Then, differs both cases, it is 5, thus inspected.