A performance evaluation test for laser line scanners on CMMs

摘要: This paper presents a performance evaluation test for laser line scanners on 3D coordinate measuring machines (CMMs). Laser are becoming more popular in recent years, mainly free form inspection tasks and reverse engineering. Error specification of these is difficult because many influencing factors like surface quality, orientation scan depth. Therefore, procedures verification conventional contact probes (e.g. touch-trigger probes) not appropriate non-contact scanners. A straightforward method that uses planar artefact proposed. It enables to identify the influence in-plane out-of-plane angle, as well depth systematic random errors scanner. Experimental results show tested commercial scanner, after calibration, exhibits about 10 μm.