Calculations of electron fluence correction factors using the Monte Carlo code PENELOPE.
作者： E A Siegbahn , B Nilsson , J M Fern ndez-Varea , P Andreo
DOI: 10.1088/0031-9155/48/10/302
关键词:
摘要: In electron-beam dosimetry, plastic phantom materials may be used instead of water for the determination absorbed dose to water. A correction factor waterplastic is then needed converting electron fluence in at an equivalent depth The recommended values this given by AAPM TG-25 (1991 Med. Phys. 18 73–109) and IAEA protocols TRS-381 (1997) TRS-398 (2000) disagree, particular large depths. Calculations have been done, using Monte Carlo code PENELOPE, semi-infinite phantoms common (PMMA, clear polystyrene, A-150, polyethylene, Plastic water™ Solid (WT1)). simulations carried out monoenergetic beams 6, 10 20 MeV, as well a realistic clinical beam. simulated factors differ from recommendations up 2%, are better agreement with obtained Ding et al (1997 24 161–76) EGS4. Our calculations also good accordance measured almost perturbation-free ion chamber. important interdependence between depth- fluence-scaling corrections discussed. Discrepancies explained considering different depth-scaling rules used.
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