Deflection measuring device according to the interferometer principle
作者： Henrik Krisch
DOI:
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摘要: An interferometer type deflection measuring device having a radiation source, first fiber-optic means forming light path, second body and an evaluation circuit, the receiving from source on input side, guided in means, respectively, being brought together output side with interference conveyed to circuit for evaluation. The are arranged only body, at least one of connected beam single feed optical fiber by fiber.
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