作者: G. Jayaram , L.D. Marks , M.R. Hilton
DOI: 10.1016/0257-8972(95)02520-0
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摘要: Abstract High-resolution electron microscopy imaging and X-ray diffraction techniques have been used to characterize the structure of low high flux Au-20% Pd layers in Pd/MoS 2 multilayer solid lubricant thin films. Images clearly reveal different morphologies for metal two regimes, which can be correlated variation fracture resistance reported by an earlier indentation study. In lower regime, three-dimensional islands with single-crystal multiply twinned structures are seen, while quasi-continuous, polycrystalline regions seen higher case.