作者: W. Chen , K.G. McCarthy , M. Çopuroğlu , H. Doyle , B. Malic
DOI: 10.1016/J.TSF.2010.12.194
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摘要: Abstract This work studies the impact of adding nanoparticles to high-k PMNT (lead magnesium niobate–lead titanate, Pb(Mg0.33Nb0.67)0.65Ti0.35O3) thin films. films were grown on Pt(111)/TiO2/SiO2/Si substrate using a sol–gel technique. Ligand stabilised added material with aim seeding crystallization process. The measurements show that use in influences remanent polarization, coercive field and dielectric constant. These characterization results support ongoing investigation ferroelectric electrical properties which are necessary before novel can be used silicon applications.