Ultralow dielectric losses in pyrochlore films of the PbO–MgO–Nb2O5–TiO2 system
作者： X. H. Zhu , E. Defaÿ , A. Suhm , E. Fribourg-blanc , M. Aïd
DOI: 10.1063/1.3106107
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摘要: (1−x)Pb(Mg1/3Nb2/3)O3-xPbTiO3 (PMNT) (with x=0.1) thin films were prepared on Pt-coated silicon substrates by radio-frequency magnetron sputtering and postdeposition annealing method. A well-crystallized pyrochlore phase structure, which started to nucleate grow at 450–500 °C, was formed in the PMNT films. These pyrochlore-structured show ultralow dielectric losses with a typical loss tangent as low 0.001, accompanied relatively high constant (er=176). Such an extremely loss, having never been obtained of perovskite PMNT, is probably ascribed specific structural feature phase, chemically different from its counterpart, avoidance polar domain-related losses.
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