作者: A. Yamaguchi , I. Ichishima , S. Mizushima
DOI: 10.1016/0371-1951(58)80055-7
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摘要: Abstract Intensity ratio of the two components reflected infrared radiation was measured with Perkin-Elmer 112G instrument, one component being polarized parallel to grooves grating and other perpendicular them. The found depend considerably on direction incident beam respect surface be quite different from that obtained in a similar measurement prism spectrometer.