作者: M. Ashhab , M.V. Salapaka , M. Dahleh , I. Mezić
DOI: 10.1016/S0005-1098(99)00077-1
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摘要: In this paper, we study the dynamical behavior of a microcantilever-sample system that forms basis for operation atomic force microscopes (AFM). We model microcantilever by single mode approximation and interaction between sample cantilever van der Waals (vdW) potential. The is vibrated sinusoidal input, its deflection detected optically. analyze forced dynamics using Melnikov method, which reveals region in space physical parameters where chaotic motion possible. addition, proportional derivative controller compute function terms controller. Using relation it possible to design controllers will remove possibility chaos.