Structural and electrical properties of bismuth telluride films grown by the molecular beam technique
作者： E. Charles , E. Groubert , A. Boyer
DOI: 10.1007/BF01730298
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sci-hub.se 参考文章(3)
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Y. H. Shing, Y. Chang, A. Mirshafii, L. Hayashi, S. S. Roberts, J. Y. Josefowicz, N. Tran, Sputtered Bi2Te3 and PbTe thin films Journal of Vacuum Science and Technology. ,vol. 1, pp. 503- 506 ,(1983) , 10.1116/1.571916