作者: R. K. Vasudevan , A. N. Morozovska , E. A. Eliseev , J. Britson , J.-C. Yang
DOI: 10.1021/NL302382K
关键词:
摘要: … for oxide ferroics in future nanoscale electronics. … through wall charge in ferroelectric thin films. The average current at … Computational support for this research for phase field simulations …