System and method for heating semiconductor in standard test environment
作者： Wenfeng Wu , Lau C T , Chue S S H
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摘要:
lens.org 参考文章(3)
Al A Martin Et, Asam W, Fasekars J, High temperature reliability measuring device and method for integrated semiconductor module ,(2003)
Hagiwara Junichi, INSPECTING METHOD AND INSPECTING APPARATUS ,(1996)