Engineering aspects and applications of the new Raman instrumentation

作者: G.D. Pitt , D.N. Batchelder , K.P.J. Williams , S. Webster , K.J. Baldwin

DOI: 10.1049/IP-SMT:20050015

关键词:

摘要: Raman instrumentation design has improved radically in efficiency and ease of use over the past 15 years. New technologies made this possible with introduction first commercial high-efficiency (high speed) systems incorporating low power lasers. Systems were introduced for time on production process lines. Higher have continued to evolve, as a result novel engineering solutions. Raman-near field optical Raman-SEM (scanning electron microscopy) combinations created new area nanoscale spectroscopic measurements. application areas are: (a) semiconductor processing; (b) pharmaceutical drug (c) gemology; (d) narcotic explosives forensic detection; (e) coatings computer hard disks read heads; (f) endoscopic detection oesophageal other types cancer. Comparisons are competing alternative techniques general work applications.

参考文章(167)
Bernard J. Bulkin, Jeanette G. Grasselli, Analytical Raman spectroscopy Wiley. ,(1991)
C. Cheng, T. E. Kirkbride, D. N. Batchelder, R. J. Lacey, T. G. Sheldon, IN SITU DETECTION AND IDENTIFICATION OF TRACE EXPLOSIVES BY RAMAN MICROSCOPY Journal of Forensic Sciences. ,vol. 40, pp. 31- 37 ,(1995) , 10.1520/JFS13756J
Howard S. Sands, Ian P. Hayward, Tracy E. Kirkbride, Robert Bennett, Richard J. Lacey, David N. Batchelder, UV-Excited Resonance Raman Spectroscopy of Narcotics and Explosives Journal of Forensic Sciences. ,vol. 43, pp. 509- 513 ,(1998) , 10.1520/JFS16178J
K. W. R. Gilkes, H. S. Sands, D. N. Batchelder, J. Robertson, W. I. Milne, Direct observation of sp3 bonding in tetrahedral amorphous carbon using ultraviolet Raman spectroscopy Applied Physics Letters. ,vol. 70, pp. 1980- 1982 ,(1997) , 10.1063/1.118798
Jonathan V. Sweedler, M. Bonner Denton, Kenneth L. Ratzlaff, Charge-Transfer Devices in Spectroscopy ,(1994)
C. H. Townes, A. Javan, Optical and Infrared Masers Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT). ,(1962)