作者: Shaochen Chen , Costas P. Grigoropoulos , Hee K. Park , Pieter Kerstens , Andrew C. Tam
DOI: 10.1063/1.122388
关键词:
摘要: A photothermal displacement method has been developed to probe the pulsed laser-induced transient melting and surface deformation of Ni–P hard disk substrates. probing He–Ne laser beam is aligned collinearly with near-infrared nanosecond heating beam. The spot scanned on microfeatures formed sample by heating. deflection signals show variation feature shape resulting from different pulse energies signal also reveals that time scale motion in range several hundred nanoseconds.