XAFS and XRD Studies of the Cd1-xZnxTe Crystal Fine Structure
作者： Feng Tao , Zha Gangqiang , Yang Jian , Li Jiong , Jiang Zheng
DOI: 10.1088/1742-6596/430/1/012087
关键词:
摘要: Cd1−xZnxTe crystal is a new kind of room temperature semiconductor radiation detector material developed in recent years. zinc-blende structure, which similar to CdTe, but the fine structure ternary compound different from CdTe and ZnTe binary semiconductors. In this contribution, has been studied by synchrotron X-ray absorption (XAFS) technology diffraction (XRD) technology. The K-edges XAFS spectra cadmium, zinc tellurium have obtained, differences between structures crystals also analyzed. Fourier transform k2-weighted prove that Zn atoms occupy position Cd atoms. bond lengths obtained extended (EXAFS), results imply local atomic distorted. doping contributes distortion, should be responsible for properties Cd1−xZnxTe. Normalized near-edge (XANES) on K-edge, K-edge Te Cd0.96Zn0.04Te, Cd0.9Zn0.1Te are shown.
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