Measurement of the elastic constants of textured anisotropic thin films from x-ray diffraction data
作者： P.-O. Renault , E. Le Bourhis , P. Villain , Ph. Goudeau , K. F. Badawi
DOI: 10.1063/1.1594280
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摘要: The elastic constants (compliances sij) of a textured anisotropic thin film deposited on substrate have been determined. Using x-ray diffraction to measure the intragranular strain and tensile machine deform in situ samples, an analytical method is described has developed for fiber films. determination compliances only requires knowledge constants. In case 260-nm-thin gold film, were found be slightly different from corresponding bulk material ones.
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