Transmission electron microscopy evidence of the defect structure in Si nanowires synthesized by laser ablation
作者： N Wang , YH Tang , YF Zhang , DP Yu , CS Lee
DOI: 10.1016/S0009-2614(97)01378-X
关键词:
摘要: … In summary, using electron diffraction and HRTEM, we have characterized the microstructure … The Si nanowires bend gradually via a high density of defects and kink abruptly along the …
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