Fundamentals and Special Applications of Non-Contact Scanning Force Microscopy

摘要: Publisher Summary This chapter discusses the fundamentals and special applications of noncontact scanning force microscopy (SFM). By critically analyzing underlying theories for various SFM applications, some conclusions concerning dominant future in science technology, further instrumental improvements, its ultimate capabilities can be drawn. One definite scientific goals is to completely understand force-versus-distance curves. The major provided by interaction between two solids at arbitrary separation with an intervening medium. Other more specific predominantly include investigation electric magnetic microfields resulting from highly localized charge spin arrangements. If technologies allow probes fabricated sharpness while keeping satisfactory mechanical properties, required probe radius solely determined requirement that has large enough so variation across sample well above thermal noise limit. Sensitivity forces or gradients spatial resolution are, thus, unequivocally related SFM. From this universal relation, it then follows would never possible image individual spins microscopy, but indeed equivalent only one electron smeared out over a certain area.