X-ray optics and beam characterization using random modulation: Theory

摘要: X-ray near-field speckle-based phase-sensing approaches provide efficient means to characterise optical elements. Here, we present a theoretical review of several these speckle methods in the frame characterisation and generalization concept. As also demonstrate experimentally another paper, theoretically developed here can be applied with different beams optics within variety situations where at-wavelength metrology is desired. By understanding differences between various processing methods, it possible find implement best suited approach for each scenario.