Surface reconstructions of (001) CdTe and their role in the dynamics of evaporation and molecular‐beam epitaxy growth

摘要: We present studies of the surface reconstruction and chemical analysis uppermost atomic layer thick thin (001) CdTe layers grown on ZnTe by (MBE). Techniques include reflection high energy electron diffraction x‐ray photoelectron spectroscopy (XPS). All surfaces obtained in temperature range used (220–300 °C) MBE are Cd covered with about 50% undimerized atoms; peak is clearly identified XPS layers. The can be (2×1), c(2×2) or (2×1)+c(2×2) reconstructed. Heating these above 300 °C leads to a (2×1) Te‐stabilized surface. A reversible transition occurs between this last mixed structure: thermal cycling two reconstructed induces evaporation half monolayer per cycle. Tentative models account for results presented correlation properties discussed.