Measurement of Thickness of Thin Films

摘要: TOLANSKY has shown in a recent series of papers1 that interference fringes formed by multiple reflexion between highly reflecting surfaces can be applied with great effectiveness to the study surface topography. Thus Tolansky been able detect abrupt changes only 20 A. level cleavage mica. We have recently this technique determination thickness thin layers gold, silica, collodion and ‘Formvar’, which are widely used for supporting other purposes electron microscopy.