A UHV Diffraction Camera With Energy Filter for Convergent Beam RHEED and TED.

作者: U. Weierstall , J.M. Zuo , T. Kjørsvikf , J.C.H. Spence

DOI: 10.1017/S1431927600014355

关键词:

摘要:

参考文章(6)
G. Lehmpfuhl, W. C. T. Dowell, Convergent‐beam reflection high‐energy electron diffraction (RHEED) observations from an Si(111) surface Acta Crystallographica Section A. ,vol. 42, pp. 569- 577 ,(1986) , 10.1107/S0108767386098720
Y Ma, S Lordi, J.A Eades, Symmetry analysis of the RHEED patterns from the Si(001)−2 × 1 surfaces Ultramicroscopy. ,vol. 60, pp. 137- 152 ,(1995) , 10.1016/0304-3991(95)00054-5
A. E. Smith, D. F. Lynch, Results of multislice matrix calculations for convergent‐beam RHEED patterns Acta Crystallographica Section A. ,vol. 44, pp. 780- 788 ,(1988) , 10.1107/S0108767388002491
M.D. Shannon, J.A. Eades, M.E. Meichle, P.S. Turner, Zone-axis patterns in reflection high-energy electron diffraction: a family of new techniques for surface characterization Ultramicroscopy. ,vol. 16, pp. 175- 192 ,(1985) , 10.1016/0304-3991(85)90072-5
Ayahiko Ichimiya, Kyozaburo Kambe, Gunter Lehmpfuhl, Observation of the Surface State Resonance Effect by the Convergent Beam RHEED Technique Journal of the Physical Society of Japan. ,vol. 49, pp. 684- 688 ,(1980) , 10.1143/JPSJ.49.684