Determination of the electron inelastic mean free path in some binary alloys for application in quantitative surface analysis
作者： M. Krawczyk , L. Zommer , J.W. Sobczak , A. Jablonski
DOI: 10.1016/J.APSUSC.2004.05.117
关键词:
摘要: Abstract Quantitative surface- and thin film analysis by electron spectroscopies (AES, XPS, EELS) requires the knowledge of one most important parameters transport such as inelastic mean free path (IMFP) electrons. Numerous data on IMFP have been already published, mainly for elemental solids some inorganic organic compounds. However, IMFPs binary alloy systems are still lacking. Although values complex can be calculated from predictive formulae, also measured experimentally elastic peak spectroscopy (EPES). The present work is dealing with experimental determination in selected alloys, i.e. AuxCu100−x (x=25, 75 at.%), AuxPd100−x (x=10, 90 at.%) AuxNi100−x (x=5 at.%) within 200–2000 eV range. relative EPES experiments performed using a double-pass CMA spectrometer Ni standard. were compared TPP-2M formula. RMS deviation equation was 0.6–2.5 A depending surface composition, it smallest Au5Ni95 alloy. percentage 4.3–17.6%.
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