Measuring thermal conductivity of nanocrystalline diamond film with a scanning thermal microscope
作者： Y Zhang , P S Dobson , J M R Weaver , S Rossi , M Alomari
DOI: 10.1109/NANO.2012.6322105
关键词:
摘要: This study has demonstrated that the thermal conductivity of small samples highly thermally conductive materials can be accurately measured using scanning microscopy (SThM) when calibrated Johnson noise thermometry. A nanocrystalline diamond film sample was in two forms, membrane and supported on a Si substrate. The results indicate is necessary for accurate measurement.
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