Nanoscale Electrical Conductivity and Surface Spectroscopic Studies of Indium−Tin Oxide
作者： Yish-Hann Liau , Norbert F. Scherer , Kent Rhodes
DOI: 10.1021/JP0040749
关键词:
摘要: Optically transparent indium−tin oxide (ITO) is a “universal” electrode for various optoelectronic devices such as organic light emitting diodes (OLEDs). It known that the performance of OLEDs improves significantly by exposing ITO surface to an oxygen plasma. This study employs conducting atomic force microscopy (C-AFM) unique nanometer-scale mapping local current density vapor-deposited film. The conductance shown increase orders magnitude and becomes more uniform after plasma treatment measurements identical 200-nm2 regions. Scanning tunneling (STM) X-ray photoelectron spectroscopy separate regions same films suggest removes thin layer insulating carbon-rich material from surface. extensive heterogeneity in interfacial electrical conductivity measured C-AFM calls into question previous studies STM-induced electroluminescence polymer on well ST...
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