Antisite defects in layered multiferroic CuCr0.9In0.1P2S6

摘要: The CuCr1-xInxP2S6 system represents a large family of metal chalcogenophosphates that are unique and promising candidates for 2D materials with functionalities such as ferroelectricity. In this work, we carried out detailed microstructural chemical characterization these compounds using aberration-corrected STEM, in order to understand the origin different ordering phenomena. Quantitative STEM-HAADF imaging analysis identified stacking an 8-layer thin flake, which leads identification anti-site In(3+)(Cu(+)) doping. We believe findings will pave way towards understanding ferroic coupling phenomena van der Waals lamellar compounds, well their potential applications 2-D electronics.