Semiconductor device with source line and fabrication method thereof

作者: Mitsuhiro Noguchi , Akira Goda

DOI:

关键词:

摘要: A semiconductor device comprises a plurality of field-effect transistors and common source line. Each the memory cell includes region first conductivity type formed in substrate, drain second region, an information storage portion capable electrically writing erasing data, at least one control gate electrode including conductive layer. The line is on type, connects regions transistors. layer that has film thickness substantially equal to included same material as electrode.

参考文章(27)
Kyu-Charn Park, Won-Hong Lee, Sung-nam Chang, Flash memory device and method of making same ,(2002)
Akihisa Murata, Katsuhito Kamiya, Toshitsugu Hosokawa, Hiraku Yamamoto, Takeshi Yamanaka, Koichi Hashimoto, Epoxy resin composition, cured product obtained therefrom, curing method therefor, and bonding method using the composition ,(1992)
Masahito Takahashi, Takayuki Yoshitake, Akihiko Satoh, Nonvolatile semiconductor memory device and a method of manufacturing the same ,(2001)
Robert Steven Clough, Mario Alberto Perez, Melt blending polyphenylene ether, polystyrene and curable epoxy ,(1998)
Arup Bhattacharyya, Gary D. Grise, Roy S. Bass, Non-volatile memory cell having Si rich silicon nitride charge trapping layer ,(1987)
Malgorzata Iwona Rubinsztajn, Gary William Yeager, Composition of cycloaliphatic epoxy resin, anhydride curing agent and boron catalyst ,(2001)