Generalized model for interface description

摘要: Abstract In this paper a complete formalism for interface description is presented. The interfaces to be described may continuous or granular and are characterized by few very general parameters: the coverable part of surface; island generating function depending on crystallographic symmetry islands clusters; maximal height an reach before it touching another, distribution heights concentrations evaporated elements. All these parameters depend coverage, time, temperature etc. allowing many phenomena which affect shape. versatile field its potential applications large grow. It well suited describe almost everything happens at surface: growth binary systems, alloys, alloying, diffusion, clusters naturally describing intensities measured spectroscopies. explicitly extended techniques. A consequence generalized break down some accepted ideas in like: premonolayer breaks, occurrence breaks only if layer type ability such techniques describe, without any other data, modes. Finally new suggested spectroscopies: adsorbate surface roughening multilayer monitoring.