Zn 1−x Te x Ovonic Threshold Switching Device Performance and its Correlation to Material Parameters

作者: Yunmo Koo , Hyunsang Hwang

DOI: 10.1038/S41598-018-30207-0

关键词:

摘要: We have experimentally demonstrated a strong correlation between the electrical properties of Zn1-xTex Ovonic threshold switching (OTS) selector device and material analysed by X-ray diffraction (XRD), spectroscopic ellipsometry, photoelectron spectroscopy (XPS). The key parameters determining performances were investigated. By comparing experimental data with calculation results from various analytical models previously developed for OTS materials, shown to be dependent on parameters; concentration sub-gap trap states bandgap energy material. This study also that those determined performance as expected model. origin phenomenon conduction mechanism explained both theoretically. leads better understanding devices, an insight process improvement optimize application.

参考文章(23)
U-In Chung, Myoung-Jae Lee, In-Kyeong Yoo, Seung Ryul Lee, Man Chang, Sungho Kim, Dongsoo Lee, Sae-Jin Kim, Chang Jung Kim, Eunju Cho, Young-Bae Kim, Kyung Min Kim, Performance of threshold switching in chalcogenide glass for 3D stackable selector symposium on vlsi technology. ,(2013)
Hellmut Fritzsche, Why are chalcogenide glasses the materials of choice for Ovonic switching devices Journal of Physics and Chemistry of Solids. ,vol. 68, pp. 878- 882 ,(2007) , 10.1016/J.JPCS.2007.01.017
M. Anbarasu, Martin Wimmer, Gunnar Bruns, Martin Salinga, Matthias Wuttig, Nanosecond threshold switching of GeTe6 cells and their potential as selector devices Applied Physics Letters. ,vol. 100, pp. 143505- ,(2012) , 10.1063/1.3700743
S.R. Ovshinsky, An introduction to ovonic research Journal of Non-Crystalline Solids. ,vol. 2, pp. 99- 106 ,(1970) , 10.1016/0022-3093(70)90125-0
Geoffrey W. Burr, Rohit S. Shenoy, Kumar Virwani, Pritish Narayanan, Alvaro Padilla, Bülent Kurdi, Hyunsang Hwang, Access devices for 3D crosspoint memorya) Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. ,vol. 32, pp. 040802- ,(2014) , 10.1116/1.4889999
M. Nardone, M. Simon, I. V. Karpov, V. G. Karpov, Electrical conduction in chalcogenide glasses of phase change memory Journal of Applied Physics. ,vol. 112, pp. 071101- ,(2012) , 10.1063/1.4738746
Daniele Ielmini, Andrea L Lacaita, None, Phase change materials in non-volatile storage Materials Today. ,vol. 14, pp. 600- 607 ,(2011) , 10.1016/S1369-7021(11)70301-7
Hao Zhang, Gang Chen, Beng Chin Ooi, Kian-Lee Tan, Meihui Zhang, In-Memory Big Data Management and Processing: A Survey IEEE Transactions on Knowledge and Data Engineering. ,vol. 27, pp. 1920- 1948 ,(2015) , 10.1109/TKDE.2015.2427795
Jong Ho Lee, Gun Hwan Kim, Young Bae Ahn, Ji Woon Park, Seung Wook Ryu, Cheol Seong Hwang, Hyeong Joon Kim, Threshold switching in Si-As-Te thin film for the selector device of crossbar resistive memory Applied Physics Letters. ,vol. 100, pp. 123505- ,(2012) , 10.1063/1.3696077