Analysis of the charge state distribution in an ECRIS Ar plasma using high-resolution x-ray spectra
作者： J P Santos
DOI: 10.1088/0953-4075/46/6/065701
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摘要: In this work, we obtained a charge state distribution inside an Ar plasma produced by electron–cyclotron-resonance ion source. The processes that lead to the observed lines in x-ray spectra are identified and included simulated spectrum. geometrical constraints of flat double crystal spectrometer, used measure spectrum, investigated as they crucial for correctly obtaining densities from transition amplitudes. Multiple electron impact ionization is included, realistic velocity taken into account. ions compared measured extracted ionic currents.
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