作者: Narendra L Mathakari , Vasant N Bhoraskar , Sanjay D Dhole , None
DOI: 10.1016/J.MSEB.2009.11.005
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摘要: Abstract Thin films of polyimide (PMDA-ODA, Kapton) having 50 μm thickness were irradiated with 6 MeV pulsed electron beam. The bulk and surface properties pristine samples characterized by several techniques such as stress–strain measurements, Fourier Transform Infrared (FTIR), UV–vis spectroscopy, contact angle, atomic force microscopy (AFM) profilometry. tensile strength, percentage elongation strain energy show an enhancement from value 73–89 MPa, 10–22% 4.75–14.2 MJ/m 3 respectively at the maximum fluence 4 × 10 15 electrons/cm 2 . This signifies that being excessively aromatic polymer is crosslinked due to high-energy irradiation. In properties, angle shows a significant decrease 59° 32° indicating in hydrophilicity. mainly attributes roughening, which beam induced sputtering. roughening confirmed AFM profilometry measurements. images clearly roughness increases after Moreover, average ( R ) measured profilograms found increase 0.06 0.1. FTIR spectra do not noticeable changes regards scissioning bonds oxidation. work leads definite conclusion can be used bring about desired well polyimide, considered high performance space quality polymer.