Highly-charged ions and high-resolution mass spectrometry in a Penning trap
作者： K. Blaum , R. Schuch
DOI: 10.1007/978-3-540-77817-2_5
关键词:
摘要: This Lecture gives an introduction to high-precision measurements of atomic masses by using highly-charged ions in Penning traps. The production Electron Beam Ion Traps and Sources (EBIT/S) for mass spectrometry will be reviewed. transfer the actual measuring techniques/methods also explained, mostly example \textsc{Smiletrap} Penning-trap spectrometer. Finally, we discuss selected examples applications modern physics related fundamental problems.
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