Atom Probe Tomography and Microscopy APT&M 2018 Organized under the auspices of the International Field Emission Society June 10th–15th, 2018, Gaithersburg, Maryland, United States

摘要: Preface: The biennial International Field Emission Symposium, recently renamed Atom Probe Tomography and Microscopy (APT&M), has been in existence since 1952. It was at the 14th Field Emission Symposium (June 1967), held in the Green Auditorium at the National Bureau of Standards (now National Institute of Standards and Technology), that Erwin W. Müller and John A. Panitz first introduced the atom probe field ion microscope. A half-century later, the International Field Emission Society (IFES) returned to the NIST-Gaithersburg campus to hold APT&M 2018, the 56th International Field Emission Society Meeting (June 10–June 15). APT&M 2018 was well attended, with 215 registered attendees representing institutions from 17 different countries. The meeting agenda offered a broad range of interdisciplinary topics related to atom probe microscopy, field ion microscopy, and high-field nanoscience. The …