Understanding the Potential and Limitations of Tunnel FETs for Low-Voltage Analog/Mixed-Signal Circuits
Pierpaolo PALESTRI , Francesco SETTINO , David ESSENI , Sebastiano STRANGIO
Quasi-Ballistic Gamma-and L-Valleys Transport in Ultrathin Body Strained (111) GaAs nMOSFETs
David ESSENI , Pierpaolo PALESTRI , Enrico CARUSO , Luca SELMI
Energy minimization and Kirchhoff’s laws in Negative Capacitance Ferroelectric Capacitors and MOSFETs
David ESSENI
Quantum simulation of a heterojunction vertical tunnel FET based on 2D transition metal dichalcogenides
David ESSENI
An Improved Surface Roughness Scattering Model for Bulk, Thin-Body, and Quantum-Well MOSFETs
David ESSENI , Daniel LIZZIT , Luca SELMI , Oves Mohamed Hussein BADAMI
Operation and Design of van der Waals Tunnel Transistors: A 3-D Quantum Transport Study
David ESSENI
Impact of inelastic phonon scattering in the OFF state of Tunnel-field-effect transistors
David ESSENI
Surface roughness limited mobility in multi-gate FETs with arbitrary cross-section
David ESSENI , Oves Mohamed Hussein BADAMI , Ruben SPECOGNA
Revisiting piezoelectric FETs with sub-thermal swing
David ESSENI , XUANCHENG JIANG
Benchmarking of 3-D MOSFET Architectures: Focus on the Impact of Surface Roughness and Self-Heating
Pierpaolo PALESTRI , David ESSENI , Oves Mohamed Hussein BADAMI , Francesco DRIUSSI
Nanoscale MOS Transistors: Semi-Classical Transport and Applications
Luca Selmi , David Esseni , Pierpaolo Palestri
82
2011
A numerical model for the oscillation frequency, the amplitude and the phase-noise of MOS-current-mode-logic ring oscillators
Luca Selmi , David Esseni , Michele Nocente , Donald Fontanelli
International Journal of Circuit Theory and Applications 38 ( 6) 607 -629
6
2010
Low-voltage high-performance III-V semiconductor MOSFETs for advanced CMOS nodes: impact of strain and interface traps
Patrik Osgnach , Daniel Lizzit , Enrico Caruso , Luca Selmi
GE2015, 47th Conference 77 -78
2015
Evaluation of Ultra-Thin Double Gate MOSFETs for the 45 nm Technology Node
Claudio Fiegna , David Esseni , Enrico Sangiorgi , Nicola Barin
Meeting Abstracts ( 12) 533 -533
2006
Physics-based TCAD analysis of Border and Interface traps in Al2O3/InGaAs stacks using Multifrequency CV-curves
David Esseni , Scott Monaghan , Paul K. Hurley , Jun Lin
WODIM 2018 - 20th Workshop on Dielectrics in Microelectronics
2018
European Patent application no.00830546.8, filing date july 31 2000
Luca Selmi , R. Bez , David Esseni , A. Modelli
2000
Mobility in Single and Double Gate Ultra-Thin SOI MOSFETs
C. Fiegna , Luca Selmi , David Esseni , M. Mastrapasqua
European Workshop on Ultimate Integration of Silicon (ULIS) 87
2001
Bipolar Flash Memory (BipFlash) - A new Architecture for a Non-Volatile Memory with a High Programming Efficiency
Luca Selmi , R. Bez , David Esseni , A. Modelli
2002
Investigating electrically active defect distributions in MOS structures based on inelastic tunneling interaction with border traps and a nonlocal model for interface traps
Karim Cherkaoui , Enrico Caruso , Luca Selmi , Farzan Gity
1 -2
2019