W. Van Moer , Y. Rolain , A. Barel
European Gallium Arsenide and Other Semiconductor Application Symposium, GAAS 2005 325 -328
R. Pintelon , J. Schoukens , F. Peeters , Y. Rolain
International modal analysis conference 1355 -1361
C. Soens , G. Van der Plas , Y. Rolain , G. Vandersteen
design, automation, and test in europe 1520 -1525
I. Bolsens , P. Wambacq , J. Schoukens , Y. Rolain
design, automation, and test in europe 164 -168
J. Borremans , Y. Rolain , P. Wambacq , L. De Locht
design, automation, and test in europe 261 -266
J. Shoukens , L. Monticelli , Y. Rolain
Periodica Polytechnica Electrical Engineering 36 185 -196
Dominique Schreurs , C. Gaquière , M. Fernandez Barciela , M. Vanden Bossche
Benelux Meeting on Systems and Control 82 -82
T. Dobrowiecki , R. Pintelon , J. Schoukens , Y. Rolain
Proceedings of the 25th International Conference on Noise and Vibration Engineering, ISMA 481 -486
Ludwig De Locht , Gerd Vandersteen , Yves Rolain , Rik Pintelon
IEEE Transactions on Instrumentation and Measurement 55 ( 4) 1186 -1191
A. Geens , Y. Rolain , W. Van Moer , K. Vanhoenacker
IEEE Transactions on Instrumentation and Measurement 52 ( 1) 197 -202
G. Vandersteen , A. Barel , Y. Rolain
IEEE Transactions on Instrumentation and Measurement 51 ( 6) 1204 -1209
Rik Pintelon , Yves Rolain , Wendy Van Moer ,
IEEE Transactions on Instrumentation and Measurement 52 ( 1) 61 -68
J. Schoukens , Y. Rolain , G. Simon , R. Pintelon
IEEE Transactions on Instrumentation and Measurement 52 ( 4) 1021 -1024
W. Van Moer , Y. Rolain
IEEE Transactions on Instrumentation and Measurement 53 ( 3) 787 -791
R. Pintelon , Y. Rolain , G. Vandersteen , J. Schoukens
IEEE Transactions on Instrumentation and Measurement 53 ( 3) 863 -876
Y. Rolain , W. Van Moer
IEEE Transactions on Instrumentation and Measurement 53 ( 3) 830 -838
R. Pintelon , G. Vandersteen , L. De Locht , Y. Rolain
IEEE Transactions on Instrumentation and Measurement 53 ( 3) 854 -862
Y. Rolain , W. Van Moer , G. Vandersteen , J. Schoukens
IEEE Transactions on Instrumentation and Measurement 53 ( 3) 726 -729
R. Pintelon , J. Schoukens , W. Van Moer , Y. Rolain
IEEE Transactions on Instrumentation and Measurement 50 ( 4) 855 -863
Y. Rolain , W. Van Moer , G. Vandersteen , M. van Heijningen
IEEE Transactions on Instrumentation and Measurement 50 ( 4) 959 -964