Measuring and modelling a microwave amplifier by means of the LSNA

W. Van Moer , Y. Rolain , A. Barel
European Gallium Arsenide and Other Semiconductor Application Symposium, GAAS 2005 325 -328

1
2005
Nonparametric identification of rotor-bearing systems in the frequency domain

R. Pintelon , J. Schoukens , F. Peeters , Y. Rolain
International modal analysis conference 1355 -1361

2000
Interactive presentation: Simulation methodology and experimental verification for the analysis of substrate noise on LC-VCO's

C. Soens , G. Van der Plas , Y. Rolain , G. Vandersteen
design, automation, and test in europe 1520 -1525

1
2007
Efficient bit-error-rate estimation of multicarrier transceivers

I. Bolsens , P. Wambacq , J. Schoukens , Y. Rolain
design, automation, and test in europe 164 -168

10
2001
Nonlinearity analysis of Analog/RF circuits using combined multisine and volterra analysis

J. Borremans , Y. Rolain , P. Wambacq , L. De Locht
design, automation, and test in europe 261 -266

15
2007
IDENTIFICATION OF LINEAR SYSTEMS IN THE PRESENCE OF NONLINEAR DISTORTIONS

J. Shoukens , L. Monticelli , Y. Rolain
Periodica Polytechnica Electrical Engineering 36 185 -196

5
1992
A round-robin benchmark for the Large Signal Network Analyzer

Dominique Schreurs , C. Gaquière , M. Fernandez Barciela , M. Vanden Bossche
Benelux Meeting on Systems and Control 82 -82

3
2007
Frequency response function measurements in the presence of non-linear distortions. A general framework and practical advices

T. Dobrowiecki , R. Pintelon , J. Schoukens , Y. Rolain
Proceedings of the 25th International Conference on Noise and Vibration Engineering, ISMA 481 -486

1
2000
Estimating parameterized scalable models from the best linear approximation of nonlinear systems for accurate high-level simulations

Ludwig De Locht , Gerd Vandersteen , Yves Rolain , Rik Pintelon
IEEE Transactions on Instrumentation and Measurement 55 ( 4) 1186 -1191

3
2006
Discussion on fundamental issues of NPR measurements

A. Geens , Y. Rolain , W. Van Moer , K. Vanhoenacker
IEEE Transactions on Instrumentation and Measurement 52 ( 1) 197 -202

9
2003
Broadband high-frequency hybrid

G. Vandersteen , A. Barel , Y. Rolain
IEEE Transactions on Instrumentation and Measurement 51 ( 6) 1204 -1209

3
2002
Probability density function for frequency response function measurements using periodic signals

Rik Pintelon , Yves Rolain , Wendy Van Moer ,
IEEE Transactions on Instrumentation and Measurement 52 ( 1) 61 -68

50
2003
Fully automated spectral analysis of periodic signals

J. Schoukens , Y. Rolain , G. Simon , R. Pintelon
IEEE Transactions on Instrumentation and Measurement 52 ( 4) 1021 -1024

62
2003
Measuring the sensitivity of microwave components to bias variations

W. Van Moer , Y. Rolain
IEEE Transactions on Instrumentation and Measurement 53 ( 3) 787 -791

6
2004
Experimental characterization of operational amplifiers: a system identification approach-part II: calibration and measurements

R. Pintelon , Y. Rolain , G. Vandersteen , J. Schoukens
IEEE Transactions on Instrumentation and Measurement 53 ( 3) 863 -876

26
2004
Block-oriented instrument software design

Y. Rolain , W. Van Moer
IEEE Transactions on Instrumentation and Measurement 53 ( 3) 830 -838

3
2004
Experimental characterization of operational amplifiers: a system identification Approach-part I: theory and Simulations

R. Pintelon , G. Vandersteen , L. De Locht , Y. Rolain
IEEE Transactions on Instrumentation and Measurement 53 ( 3) 854 -862

65
2004
Why are nonlinear microwave systems measurements so involved

Y. Rolain , W. Van Moer , G. Vandersteen , J. Schoukens
IEEE Transactions on Instrumentation and Measurement 53 ( 3) 726 -729

14
2004
Identification of linear systems in the presence of nonlinear distortions

R. Pintelon , J. Schoukens , W. Van Moer , Y. Rolain
IEEE Transactions on Instrumentation and Measurement 50 ( 4) 855 -863

39
2001
Measuring mixed-signal substrate coupling

Y. Rolain , W. Van Moer , G. Vandersteen , M. van Heijningen
IEEE Transactions on Instrumentation and Measurement 50 ( 4) 959 -964

8
2001