Physical Mechanisms of Charge Pumping and DCIV Currents in Floating-Body SOI MOSFETs
Dan Fleetwood , Ron Schrimpf , Eddy Simoen , Enxia Zhang
Meeting Abstracts ( 32) 2641 -2641
2012
A Physically Unclonable Function with 0% BER Using Soft Oxide Breakdown in 40nm CMOS
Kai-Hsin Chuang , Erik Bury , Robin Degraeve , Ben Kaczer
2018 IEEE Asian Solid-State Circuits Conference (A-SSCC) 157 -160
2
2018
Potentials of the 90 nm CMOS technology for monolithic integration
Piet Wambacq , Stefaan Decoutere , Dimitri Linten , Javier Ramos
Revue HF ( 2) 17 -28
2005
ESD characterization of high mobility SiGe Quantum Well and Ge devices for future CMOS scaling
Geert Hellings , Dimitri Linten , Liesbeth Witters , Guido Groeseneken
electrical overstress electrostatic discharge symposium 1 -6
5
2012
CDM protection of a 3D TSV memory IC with a 100 GB/s wide I/O data bus
Dimitri Linten , Satoshi Takaya , Masanori Sawada , Mirko Scholz
electrical overstress electrostatic discharge symposium 1 -7
3
2014
ESD protection devices placed inside keep-out zone (KOZ) of through Silicon Via (TSV) in 3D stacked integrated circuits
Geert Hellings , Dimitri Linten , Guido Groeseneken , Mirko Scholz
electrical overstress electrostatic discharge symposium 1 -8
11
2012
Behavior of RF MEMS switches under ESD stress
Vladimir Cherman , Dimitri Linten , Guido Groeseneken , Mirko Scholz
electrical overstress electrostatic discharge symposium 1 -8
7
2010
Exploring ESD challenges in sub-20-nm bulk FinFET CMOS technology nodes
Geert Hellings , Dimitri Linten , Guido Groeseneken , Mirko Scholz
electrical overstress/electrostatic discharge symposium 1 -8
7
2013
Impact of the on-chip and off-chip ESD protection network on transient-induced latch-up in CMOS IC
Geert Hellings , Dimitri Linten , Mirko Scholz , Shih-Hung Chen
electrical overstress/electrostatic discharge symposium 1 -7
3
2013
A study of breakdown mechanisms in electrostatic actuators using mechanical response under EOS-ESD stress
Dimitri Linten , Guido Groeseneken , Mirko Scholz , Steven Thijs
2009 31st EOS/ESD Symposium 1 -8
8
2009
Extended subspace identification of improper linear systems
Gerd Vandersteen , Rik Pintelon , Dimitri Linten , Stéphane Donnay
design, automation, and test in europe 1 10454
2
2004
ESD test system calibration
Dimitri Linten , David Eric Tremouilles , Mirko Scholz , Steven Thijs
3
2008
CMOS-based single-package solutions for wireless communications
Charlotte Soens , Dimitri Linten , Mustafa Badaroglu , Geert Van Der Plas
Revue HF ( 2) 29 -41
2005
Characterization of Germanium ESD devices
Geert Hellings , Dimitri Linten , Joris Van Campenhout , Liesbeth Witters
EOS/ESD Symposium Proceedings 68 -76
2014
Analysis of high voltage ESD protection devices under HBM ESD stress
Dimitri Linten , Guido Groeseneken , Mirko Scholz , Steven Thijs
Proceedings of the 2nd International ESD Workshop - IEW
2008
Simulation-based transient-induced latchup analysis
Geert Hellings , Dimitri Linten , Mirko Scholz , Shih-Hung Chen
7th International ESD Workshop - IEW
2013
Utilizing Keep-Out Zone (KOZ) of Through Silicon Via (TSV) for ESD protection devices in 3D stacking integrated circuits
Dimitri Linten , Guido Groeseneken , Steven Thijs , Shih-Hung Chen
International ESD Workshop - IEW 391 -399
1
2012
Electrostatic discharge (ESD) protection for sub-90nm RFCMOS designs
Dimitri Linten , Guido Groeseneken , Natarajan Mahadeva Iyer
2005
System-level ESD protection of high-voltage tolerant IC pins-A case study
Alessio Griffoni , Dimitri Linten , Guido Groeseneken , Masanori Sawada
35 -38
4
2011
Total-dose response of HfO2/Hf-based bipolar resistive memories
D. M Fleetwood , Dimitri Linten , R. D Schrimpf , Mike McCurdy
Nuclear and Space Radiation Effects Conference - NSREC
2013