Sanjit K. Ghose
机构: Brookhaven National Laboratory
每年引用次数
引用次数
引用: 2,722
H-指数: 30
I10-指数 : 67
出版物: 209
X-ray filter for x-ray powder diffraction
John Jay Sinsheimer , Raymond P Conley , Nathalie CD Bouet , Eric Dooryhee
1
2018
A HIGH-PRECISION TECHNIQUE USING X-RAY REFLECTIVITY FOR THE MEASUREMENT OFSURFACE AND INTERFACE ROUGHNESS
S. K. Ghose , P. V. Satyam , D. Bahr , B. N. Dev
Current Science 69 ( 6) 526 -529
4
1995
Structure of Si(111)-7x7 during oxygen adsorption and Ar ion irradiation
R. S. Averback , S. K. Ghose , I. K. Robinson
APS March Meeting Abstracts
2002
Parameters Controlling the Partitioning of Trace Metals at the Shewanella oneidensis MR-1 Biofilm/Mineral/Water Interface: Long Period X-ray Standing Wave and XAFS Study
A. M. Spormann , J. R. Bargar , Y. Wang , S. K. Ghose
AGUFM 2007
2007
A Thermodynamic Study of Heavy Metal Adsorption at the Biofilm/Mineral Interface: Comparison Between Thermodynamic Model Results and In-situ Measurements
A. M. Spormann , J. R. Bargar , Y. Wang , S. K. Ghose
AGUFM 2007
2007
Damage accumulation in Si during high-dose self-ion implantation
Y. Zhong , C. Bailat , R. S. Averback , S. K. Ghose
Journal of Applied Physics 96 ( 3) 1328 -1335
14
2004
Self-assembled gold silicide wires on bromine-passivated Si(110) surfaces
B Rout , B Sundaravel , Amal K Das , SK Ghose
Journal of Vacuum Science & Technology B 18 ( 4) 1847 -1852
19
2000
Ion-irradiation-induced mixing, interface broadening and period dilation in Pt/C multilayers
S. K. Ghose , D. K. Goswami , B. Rout , B. N. Dev
Applied Physics Letters 79 ( 4) 467 -469
23
2001
Resonance enhancement of x-rays and fluorescence yield from marker layers in thin films
S. K. Ghose , B. N. Dev , Ajay Gupta
Physical Review B 64 ( 23) 233403
26
2001
Defect formation in Si(111)7×7 surfaces due to 200 eV Ar+ ion bombardment
S. K. Ghose , I. K. Robinson , R. S. Averback
Physical Review B 68 ( 16) 165342
3
2003
X-ray standing wave and reflectometric characterization of multilayer structures
S. K. Ghose , B. N. Dev
Physical Review B 63 ( 24) 245409
59
2001
Redistribution of Ni implanted into InP
T. K. Chini , S. K. Ghose , B. Rout , B. N. Dev
The European Physical Journal Applied Physics 13 ( 2) 83 -87
2001
Application of grazing incidence x-ray fluorescence technique to discriminate and quantify implanted solar wind
K. Kitts , Y. Choi , P. J. Eng , S. K. Ghose
Journal of Applied Physics 105 ( 6) 064905 -064905
10
2009
Clustering of Au on the faulted half of the Si(111)-7×7 unit cell
S. K. Ghose , P. A. Bennett , I. K. Robinson
Physical Review B 71 ( 7) 073407
13
2005
Temperature Dependent Atomic Structure of LuFe$_{\mathrm{2}}$O$_{\mathrm{4}}$
Thomas Emge , Sanjit Ghose , Daniel Fisher , Sang-Wook Cheong
Bulletin of the American Physical Society
2017
Atom displacement during in-situ Synchrotron Measurements in TiO2 in Stage III of flash
Pankaj Sarin , Sanjit Ghose , Rishi Raj , Devinder Yadav
2019
Unusual atom displacements in TiO2 during flash sintering
Pankaj Sarin , Sanjit Ghose , Rishi Raj , Devinder Yadav
2019
Insights into reactive flash sintering of MgO-Al2O3-(8YSZ) by in-situ synchrotron X-ray diffraction
Sanjit Ghose , Rishi Raj , Devinder Yadav , Bola Yoon
2019
In-situ x-ray characterization of phase evolution during solid-state reactions of multicomponent systems
Sanjit Ghose
2019
Direct Measurements of the Atomic Displacements Related to the Ferroelectric Transition in Sn 2 P 2 S 6
Yu-Sheng Chen , Dean Evans , Han Zhang , Trevor Tyson
APS 2019
2019