引用次数
引用: 1,629
H-指数: 21
I10-指数 : 44
出版物: 152
Toward understanding the wide distribution of time scales in negative bias temperature instability
Ben Kaczer , Tibor Grasser , Raul Fernandez , Guido Groeseneken
ECS Transactions 6 ( 3) 265 -265
13
2007
Influence of gate oxide reliability on FinFET characteristics
Raul Fernandez , Ben Kaczer , Rosana Rodriguez , Montserat Nafria
2nd Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits-EUROSOI, Location: Barcelona Spain
1
2006
A new approach to modelling the impact of EMI on MOSFET DC behavior
S BenDhia , A Boyer , R Fernandez-Garcia , I Gil
2011
EMI Reduction in Parallel Multiconverter Topology Using Interleaving and Frequency Modulation Techniques
J Balcells , F Bogonez , R Fernandez-Garcia , J Gago
2010
Experimental investigations on electrical stress impact on integrated circuit electromagnetic emission
A Boyer , S Ben Dhia , B Li , N Berbel
IEEE Trans. on EMC, vol. PP ( 99)
6
2013
OT6. 236-A Textile Electrochemical Sensor based on Ag Coated Fibers
M Martínez-Estrada , I Gil , R Fernández-García
Lectures 191 -192
2024
An alternative method to quantify the electromagnetic immunitybasedontheWeibull distribution
R Fernández-García , I Gil
IEICE Electronics Express 10 ( 5) 1 -5
Dependence of the post-breakdown performance of MOS devices on the gate oxide BD spot electrical properties
R Fernández , M Porti , R Rodríguez , M Nafría
Breakdown Spot Electrical Properties at the nanoscale and their impact on the Post-Breakdown Performance of MOS Devices
M Porti , R Fernández , R Rodríguez , M Nafría
Nanophysics, Nanoclusters And Nanodevices 125 -125
2006
DC broken down MOSFET model for circuit reliability simulation
R. Fernández , R. Rodríguez , M. Nafría , X. Aymerich
Electronics Letters 41 ( 6) 368 -370
9
2005
Ring oscillator behavior after oxide breakdown
R Fernandez , R Rodriguez , M Nafria , X Aymerich
VLSI Circuits and Systems II 5837 374 -379
2005
Acknowledgement to Reviewers of Inventions in 2018
Inventions Editorial Office ,
Inventions 4 ( 1) 5 -5
2019