John Michael Walls
机构: Loughborough University
每年引用次数
引用次数
引用: 5,479
H-指数: 35
I10-指数 : 125
出版物: 302
Metrology of silicon photovoltaic cells using Coherence Correlation Interferometry
B Maniscalco , P. M. Kaminski , M Conroy , D Mansfield
photovoltaic specialists conference 003370 -003374
2
2011
A specimen temperature controller for field emission and field-ion microscopy
J M Pelmore , C J S Chapman , J M Walls , G G Summers
Journal of Physics E: Scientific Instruments 9 ( 2) 96 -97
5
1976
Magnification in the field-ion microscope
J M Walls , H N Southworth
Journal of Physics D 12 ( 5) 657 -667
18
1979
The shape of field-ion emitters
R D Webber , J M Walls
Journal of Physics D 12 ( 9) 1589 -1595
10
1979
Ion trajectories in the field-ion microscope
R Smith , J M Walls
Journal of Physics D 11 ( 4) 409 -419
40
1978
Advanced metrology of Laser Groove Buried Contact processing for silicon CPV
B Maniscalco , P M Kaminski , K Bass , A Abbas
MRS Proceedings 1447 ( 1) 85 -90
2012
Modelling the interaction of silane and disilane with Si{100}(2×1) using classical many-body potentials
Roger Smith , P.E Rhodes , J.M Walls
Computational Materials Science 11 ( 1) 65 -73
1998
Field-ion microscope observations of helium ion bombardment damage in tungsten
J.M Walls , R.M Boothby , H.N Southworth
Surface Science 61 ( 2) 419 -434
19
1976
Quantitative analysis of field-ion micrographs using moiré techniques
H.N Southworth , J.M Walls
Surface Science 67 ( 1) 299 -316
1
1977
The Effect of Annealing Pressure and Time on the Crystallinity of CZTSe
RAMAZAN KATIRCI , JOHN MICHAEL WALLS
Surface Review and Letters 26 ( 02) 1850151
1
2019
ION-BOMBARDMENT AND THE STABILITY OF FIELD-EMISSION SOURCES
R SMITH , R THURSTANS , JM WALLS
ULTRAMICROSCOPY 5 ( 2) 261 -262
1980
Ion trajectories and projection geometry in the field-ion microscope(noting emitter geometry)
R SMITH , JM WALLS
1977
Ball cratering: a sample preparation technique for transmission electron microscopy
ZOUNG YONG-AN , JS BATES , JM WALLS
Conference series-Institute of physics ( 68) 375 -378
1
1983
GET SIGNIFICANT DATA GAINS IN ORGANIC-SURFACE ANALYSIS
DR KINGHAM , CH RICHARDSON , JM WALLS
RESEARCH & DEVELOPMENT 30 ( 9) 120 -&
1988
A FIELD-ION MICROSCOPE IMAGING ATOM PROBE FOR INSITU SURFACE STUDIES
S DONE , JM WALLS
INSTITUTE OF PHYSICS CONFERENCE SERIES ( 68) 495 -498
1983
CHEMICAL DECOMPOSITION BY ELECTRON AND ION-IRRADIATION OF INSULATOR SURFACES-CORRELATION WITH SUBSTRATE-FREE ENERGY
AB CHRISTIE , I SUTHERLAND , JM WALLS
RADIATION PHYSICS AND CHEMISTRY 22 ( 6) 1050 -1050
1983
THE DEPTH OF LOW-ENERGY ION-BOMBARDMENT DAMAGE IN TUNGSTEN
RD WEBBER , JM WALLS
ULTRAMICROSCOPY 5 ( 2) 252 -253
1980
SA GULLICK
M FRANÇON , JM WALLS , HN SOUTHWORTH
Optica Acta 20 ( 1) 82 -82
1973
BIBLIOGRAPHY, by AH Agaianian. IFI/Plenum (New York), 1979. 243 pp.($05).
JM WALLS , MICROELECTRONIC PACKAGING-A