Jean-Marc Routoure
机构: professeur des universités caen
每年引用次数
引用次数
引用: 1,070
H-指数: 19
I10-指数 : 30
出版物: 124
Assessment of temperature dependence of the low frequency noise in unstrained and strained FinFETs
R. Talmat , H. Achour , B. Cretu , J-M. Routoure
international conference on noise and fluctuations 131 -134
3
2011
Experimental evidence of correlation between 1/f noise level and metal-to-insulator transition temperature in epitaxial La 0.7 Sr 0.3 MnO 3 thin films
L Méchin , S Wu , B Guillet , P Perna
Journal of Physics D 46 ( 20) 202001
10
2013
Detailled characterisation of SOI n-FinFETs at very low temperature
H. Achour , B. Cretu , J. Routoure , R. Carin
international conference on ultimate integration on silicon 125 -128
2013
Unusual noise behavior versus temperature in nFinFETs on silicon on insulator (SOI) substrates processed with different strain techniques
Nadine Collaert , Abdelkarim Mercha , Wei Guo , Sofie Put
Proceedings of the EUROSOI Workshop Proceedings: 4th Workshop of the Thematic Network on Silicon-on-Insulator Technology, Devices and Circuits 141 -142
2008
Low frequency noise spectroscopy in advanced nFinFETs
A Benfdila , Nadine Collaert , H Achour , Eddy Simoen
Seventh Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits 55 -56
2011
Low-frequency noise in low temperature unhydrogenated polysilicon thin film transistors
A Mercha , J Rhayem , L Pichon , M Valenza
Microelectronics Reliability 40 ( 11) 1891 -1896
9
2000
Meyer–Neldel parameter as a figure of merit for quality of thin-film-transistor active layer?
L Pichon , A Mercha , J.M Routoure , R Carin
Thin Solid Films 427 ( 1) 350 -354
11
2003
Volume charge carrier number fluctuations probed by low frequency noise measurements in InN layers
Geeta Rani Mutta , Jean Marc Routoure , Bruno Guillet , Laurence Méchin
Applied Physics Letters 98 ( 25) 252104
8
2011
Low-frequency noise spectroscopy of bulk and border traps in nanoscale devices
Eddy Simoen , Bogdan Cretu , Wen Fang , Marc Aoulaiche
Solid State Phenomena 242 449 -458
9
2015
Low frequency excess noise measurements in high frequency polysilicon emitter bipolar transistors
Jean Marc Routoure , Jacques Lepaisant , Daniel Bloyet , Serge Bardy
Solid-State Electronics 43 ( 4) 729 -740
3
1999
How to measure intrinsic low frequency noise in thin film samples
S. Wu , B. Guillet , L. Mechin , J-M Routoure
international conference on noise and fluctuations 1 -3
2013
Low-Frequency Noise Studies on Fully Depleted UTBOX Silicon-on-Insulator nMOSFETs: Challenges and Opportunities
Eddy Simoen , Marc Aoulaiche , SD Dos Santos , JA Martino
ECS Journal of Solid State Science and Technology 2 ( 11)
15
2013
Enhanced electrical and magnetic properties in La {sub 0.7} Sr {sub 0.3} MnO {sub 3} thin films deposited on CaTiO {sub 3}-buffered silicon substrates
C Adamo , L Méchin , B Guillet , S Wu
APL materials 3 ( 6)
2015
Structural, 1/f Noise and MOKE Characterization of Vicinal La _0.7 Sr _0.3 MnO _3 Thin Films
Laurence Mechin , P Perna , M Saïb , M Belmeguenai
Acta Physica Polonica A 111 ( 1) 63 -70
4
2007
La {sub 0.7} Sr {sub 0.3} MnO {sub 3} thin films on Bi {sub 4} Ti {sub 3} O {sub 12}/CeO {sub 2}/yttria-stabilised-zirconia buffered Si (0 0 1) substrates: Electrical, magnetic and 1/f noise properties
L Mechin , P Perna , C Barone , J-M Routoure
Materials Science and Engineering. B, Solid-State Materials for Advanced Technology 144
2007
Low‐Frequency Noise Behavior in P‐channel SOI FinFETs Processed With Different Strain Techniques
Wei Guo , Rachida Talmat , Bogdan Cretu , J‐M Routoure
AIP Conference Proceedings 1129 ( 1) 295 -298
3
2009
Low‐Frequency Noise Behavior at Low Temperature (80K–300K) of Silicon Passivated Ge pMOSFETs with High‐K Metal Gate Stack
W Guo , B Cretu , J‐M Routoure , R Carin
AIP Conference Proceedings 922 ( 1) 29 -32
2007
Low frequency noise in La 0.7 Sr 0.3 MnO 3 thin films: effects of substrate materials and contact resistance
J‐M Routoure , L Méchin , D Fadil , C Barone
AIP Conference Proceedings 922 ( 1) 229 -232
3
2007
Low temperature noise spectroscopy of 0.1 μm partially depleted silicon on insulator MOSFETs
I Lartigau , JM Routoure , R Carin , Abdelkarim Mercha
2
2003
Identification de niveaux pièges dans les oxydes de transistors MOS par des mesures de bruit basse-fréquence à différentes températures
JM Routoure , W Guo , B Cretu , I Lartigau
2008