作者: Dalin Yao , Mu Gu , Xiaolin Liu , Shiming Huang , Bo Liu
关键词: Microstructure 、 Diffraction 、 Materials science 、 Scintillation 、 Optoelectronics 、 Deposition (phase transition) 、 Luminescence 、 Scanning electron microscope 、 Crystal 、 Optics 、 X-ray crystallography
摘要: CsI(Tl) scintillation films with columnar structure are now widely used for X-ray imaging. In this work, were manufactured on glass substrates by the thermal deposition method. The influence of conditions microstructure and crystalline property was studied scanning electron microscopy (SEM) diffraction (XRD). showed only (200) plane preferred orientation when deposited at low vacuum. light outputs evaluated. one better luminescence performance than that several crystal planes. addition, spatial resolution samples given in terms modulation transfer function (MTF).