Reliability of High-Power IGBT Modules for Traction Applications
作者： Mauro Ciappa , Alberto Castellazzi
DOI: 10.1109/RELPHY.2007.369938
关键词: Power semiconductor device 、 Thermal management of electronic devices and systems 、 Traction (engineering) 、 Automotive engineering 、 Insulated-gate bipolar transistor 、 Electronic engineering 、 Engineering 、 Electromagnetic simulation
摘要: The enhancement of the system efficiency in conjunction with a reduction weight and volume transportation applications requires high temperature power devices reduced losses an optimized thermal management. This paper addresses main technology issues some recently-developed design tools to be considered order reach imposed reliability level.
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